ALEXANDRIA, Va., June 9 -- United States Patent no. 12,650,890, issued on June 9, was assigned to Maplebear Inc. (San Francisco). "Using trained machine-learning model to detect errors based on inter... और पढ़ें
ALEXANDRIA, Va., June 9 -- United States Patent no. 12,650,891, issued on June 9, was assigned to Micron Technology Inc. (Boise, Idaho). "Command address fault detection" was invented by Melissa I. U... और पढ़ें
ALEXANDRIA, Va., June 9 -- United States Patent no. 12,650,892, issued on June 9, was assigned to NXP B.V. (Eindhoven, Netherlands). "Method and apparatus for generating an error out (EOUT) signal in... और पढ़ें
ALEXANDRIA, Va., June 9 -- United States Patent no. 12,650,893, issued on June 9, was assigned to International Business Machines Corp. (Armonk, N.Y.). "Persistent and self-learning debug process for... और पढ़ें
ALEXANDRIA, Va., June 9 -- United States Patent no. 12,650,894, issued on June 9, was assigned to Suzhou MetaBrain Intelligent Technology Co. Ltd. (Suzhou, China). "Firmware detection system and meth... और पढ़ें
ALEXANDRIA, Va., June 9 -- United States Patent no. 12,650,895, issued on June 9, was assigned to Citibank N.A. (New York). "Deactivating malfunctioning artificial intelligence agents" was invented b... और पढ़ें
ALEXANDRIA, Va., June 9 -- United States Patent no. 12,650,896, issued on June 9, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea). "Memory device and a method of operating the sa... और पढ़ें
ALEXANDRIA, Va., June 9 -- United States Patent no. 12,650,897, issued on June 9, was assigned to SUZHOU METABRAIN INTELLIGENT TECHNOLOGY Co. LTD. (Suzhou, China). "Memory device control method and a... और पढ़ें
ALEXANDRIA, Va., June 9 -- United States Patent no. 12,650,898, issued on June 9, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea). "Operation method of memory controller configur... और पढ़ें
ALEXANDRIA, Va., June 9 -- United States Patent no. 12,650,899, issued on June 9, was assigned to Micron Technology Inc. (Boise, Idaho). "Data characteristic-based error correction systems and method... और पढ़ें